DocumentCode :
180923
Title :
Opportunities and Verification Challenges of Run-Time Performance Adaptation
Author :
Hashimoto, Mime
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
fYear :
2014
fDate :
16-19 Nov. 2014
Firstpage :
248
Lastpage :
253
Abstract :
Run-time performance adaptation with field delay testing is a promising approach for minimizing design margin while sustaining necessary operational margin in the field. However, run-time performance adaptation has not been adopted in industrial designs since a serious concern on timing error occurrence exists. For putting the run-time performance adaptation in a practical use, we need to verify and optimize the run-time adaptation system in design time, but a straightforward verification with logic simulation could need billion years and is totally insufficient. For this problem, we have developed a stochastic framework for error rate estimation that models adaptive speed control as a continuous-time Markov process. This paper first exemplifies the power reduction thanks to run-time performance adaptation with a 65nm test chip. Then, the proposed stochastic framework is introduced. With this framework, we evaluate MTTF of an embedded processor whose performance is adaptively controlled with online testing and offline testing. This evaluation shows how design parameters affect MTTF as an example.
Keywords :
Markov processes; adaptive control; error statistics; integrated circuit reliability; integrated circuit testing; MTTF; adaptive speed control; continuous-time Markov process; embedded processor; error rate estimation; field delay testing; industrial designs; logic simulation; offline testing; online testing; operational margin; power reduction; run-time performance adaptation; stochastic framework; timing error occurrence; Delays; Error analysis; Markov processes; Monitoring; Power dissipation; Velocity control; MTTF; error rate; offline test; online test; run-time performance adaptation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
ISSN :
1081-7735
Type :
conf
DOI :
10.1109/ATS.2014.53
Filename :
6979108
Link To Document :
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