Title :
An On-Chip Digital Environment Monitor for Field Test
Author :
Kajihara, Seiji ; Miyake, Yousuke ; Sato, Yuuki ; Miura, Yukiya
Author_Institution :
Sch. of Comput. Sci. & Syst. Eng., Kyushu Inst. of Technol., Iizuka, Japan
Abstract :
An on-chip environment monitor that can estimate a chip temperature and a power supply voltage has been developed to assist accurate circuit delay measurement by field test. The monitor consists of digital circuits and satisfies several features desired for the field test. This paper describes the architecture of the monitor and how to estimate the temperature and voltage in field, and finally shows simulation and TEG results on estimation accuracy.
Keywords :
CMOS integrated circuits; VLSI; digital circuits; estimation theory; integrated circuit testing; logic circuits; logic testing; temperature measurement; voltage measurement; TEG; chip temperature; circuit delay measurement; digital circuits; field test; on-chip digital environment monitor; power supply voltage; Aging; Estimation; Monitoring; Oscillators; Temperature measurement; Temperature sensors; Voltage measurement; field test; ring oscillator; temperature and voltage monitor;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.54
