DocumentCode
180924
Title
An On-Chip Digital Environment Monitor for Field Test
Author
Kajihara, Seiji ; Miyake, Yousuke ; Sato, Yuuki ; Miura, Yukiya
Author_Institution
Sch. of Comput. Sci. & Syst. Eng., Kyushu Inst. of Technol., Iizuka, Japan
fYear
2014
fDate
16-19 Nov. 2014
Firstpage
254
Lastpage
257
Abstract
An on-chip environment monitor that can estimate a chip temperature and a power supply voltage has been developed to assist accurate circuit delay measurement by field test. The monitor consists of digital circuits and satisfies several features desired for the field test. This paper describes the architecture of the monitor and how to estimate the temperature and voltage in field, and finally shows simulation and TEG results on estimation accuracy.
Keywords
CMOS integrated circuits; VLSI; digital circuits; estimation theory; integrated circuit testing; logic circuits; logic testing; temperature measurement; voltage measurement; TEG; chip temperature; circuit delay measurement; digital circuits; field test; on-chip digital environment monitor; power supply voltage; Aging; Estimation; Monitoring; Oscillators; Temperature measurement; Temperature sensors; Voltage measurement; field test; ring oscillator; temperature and voltage monitor;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location
Hangzhou
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2014.54
Filename
6979109
Link To Document