On-Chip Monitoring for In-Place Diagnosis of Undesired Power Domain Problems in IC Chips

An on-chip monitoring technique has realized in place diagnosis of power noise problems. On-chip voltage noise monitor (OCM) circuits are overviewed with some examples of integration in silicon chips. The OCM captures power noise waveforms in a silicon chip and provides the opportunities of diagnosis on unfavorable invisible events within a die. In-band interference of radio-frequency (RF) communication channels by power noise coupling in RF systems-on-chip (SoC) integration, and information leakage through power noise side channels from a cryptographic core are demonstrated.