DocumentCode :
180928
Title :
On-Chip Delay Sensor for Environments with Large Temperature Fluctuations
Author :
Jibing Qiu ; Guihai Yan ; Xiaowei Li
Author_Institution :
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
fYear :
2014
fDate :
16-19 Nov. 2014
Firstpage :
275
Lastpage :
280
Abstract :
The precision of on-chip delay sensors is degraded by temperature fluctuations, which hinders these sensors from applying to on-line fault predicting and DVFS. We present a novel path delay measuring technique which is immune to large temperature fluctuation. The delay reference are generated by gate biasing temperature compensation devices in which the pull-up and pull-down network are tuned to set the measurement circuit working in temperature insensitive point, thereby eliminating the precision degradation due to temperature variations. Video image scaling IP is used as experimental circuit to validate the effectiveness of the proposed technique. Experimental results show that within temperature range of -55°C to 125°C, the measurement error is reduced from 19.56% to 0.5%, compared with the techniques without temperature resilience.
Keywords :
delays; integrated circuit reliability; integrated circuit testing; DVFS; dynamic voltage scaling; frequency scaling; gate biasing temperature compensation device; on-chip delay sensor; on-line fault prediction; path delay measuring technique; pull-down network; pull-up network; temperature -55 C to 125 C; temperature fluctuations; video image scaling IP; Delay lines; Delays; Inverters; Logic gates; Semiconductor device measurement; Temperature measurement; Temperature sensors; Critical path; delay measurement; temperature resilience; temperature variation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
ISSN :
1081-7735
Type :
conf
DOI :
10.1109/ATS.2014.65
Filename :
6979113
Link To Document :
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