DocumentCode :
1809281
Title :
Intensity-noise and frequency-noise measurements in 2 μm Tm-Ho:KYF laser
Author :
Galzerano, G. ; Sani, E. ; Toncelli, A. ; Tonelli, M. ; Svelto, C. ; Bava, E. ; Taccheo, S. ; Laporta, P.
Author_Institution :
Dipt. di Fisica, Politecnico di Milano, Italy
Volume :
3
fYear :
2004
fDate :
18-20 May 2004
Firstpage :
2346
Abstract :
The development and characterization of single-mode 2-μm Tm-Ho:KYF4 (KYF) laser is here presented. In particular, both frequency noise and relative intensity noise measurements of the single-frequency oscillator have been realized. From the power spectral density of the frequency noise an emission linewidth of ∼100 kHz has been measured for the 2 μm source, whereas the intensity noise spectrum is quantum-noise limited for Fourier frequencies higher than 1 MHz.
Keywords :
holmium; laser cavity resonators; laser noise; laser tuning; quantum noise; solid lasers; thulium; 2 micron; KYF4:Tm,Ho; Tm,Ho:KYF4 laser; frequency noise measurements; laser resonator; power spectral density; quantum-noise limited; relative intensity noise measurements; single-frequency laser oscillator; single-mode laser; solid-state laser; wavelength tunability; Frequency measurement; Laser excitation; Laser noise; Lenses; Mirrors; Optical noise; Optical pumping; Optical resonators; Oscillators; Pump lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-8248-X
Type :
conf
DOI :
10.1109/IMTC.2004.1351563
Filename :
1351563
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1809281
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