DocumentCode :
180930
Title :
FPGA-Based Subset Sum Delay Lines
Author :
Chung-Yun Wang ; Yu-Yi Chen ; Jiun-Lang Huang ; Xuan-Lun Huang
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2014
fDate :
16-19 Nov. 2014
Firstpage :
287
Lastpage :
291
Abstract :
The programmable delay line is one of the key components in automatic test equipment. Recently, implementation of programmable delay lines on FPGAs has drawn growing attention due to the flexibility and reconfiguration capability that FPGAs provide. In this work, we propose the subset sum delay line (SSDL) architecture for FPGA-based delay lines. The SSDL architecture takes advantage of the inevitable FPGA process variations, structure irregularities and routing uncertainties to realize high-quality FPGA-based delay lines. Furthermore, compared to previous FPGA-based delay lines, the SSDL architecture is FPGA independent, this substantially enhances its portability across different FPGA generations and suppliers. An SSDL is realized on Alter a Cyclone II FPGA. Measurement results show that it achieves 76 ps resolution and has a dynamic range of 32 ns.
Keywords :
automatic test equipment; delay lines; field programmable gate arrays; Altera Cyclone II FPGA; SSDL architecture; automatic test equipment; inevitable process variations; programmable delay lines; structure irregularities; subset sum delay lines; time 32 ns; Delay lines; Delays; Dynamic range; Field programmable gate arrays; Histograms; Routing; ATE; FPGA; programmable delay line; subset sum;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
ISSN :
1081-7735
Type :
conf
DOI :
10.1109/ATS.2014.60
Filename :
6979115
Link To Document :
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