DocumentCode
1809319
Title
The impact of particle desorption on DARHT-II electron beam dynamics
Author
Davis, H.A. ; Merrill, F.E. ; Moir, D.C. ; Oro, D.M. ; Vermare, C. ; Wood, W.M. ; Elizondo, J.M. ; Hughes, T.P.
Author_Institution
Los Alamos Nat. Lab., NM, USA
fYear
2001
fDate
17-22 June 2001
Firstpage
522
Abstract
Summary form only given, as follows. It is well known in the intense beam community that when an intense electron beam raises the surface temperature of a solid target (e.g., electrode or aperture) to 300-400 deg C, that loosely bound adsorbed molecules are rapidly released from the surface often followed by speedy ionization. This can lead to adverse beam or diode behavior. Less well known is that even in the absence of heating, electron induced desorption of neutrals or ions can have deleterious effects on beam dynamics. We discuss computer modeling to assess the importance of desorbed particles on beam dynamics, experimental measurements to determine the level of induced desorption, and cleaning techniques to reduce adsorbed molecules on surfaces for the DARHT-II, 2 kA, 20 MeV, 2 /spl mu/s beam.
Keywords
electron beams; particle beam dynamics; 2 kA; 20 MeV; 300 to 400 C; DARHT-II electron beam dynamics; beam dynamics; cleaning techniques; computer modeling; electron induced desorption; heating; intense beam community; intense electron beam; loosely bound adsorbed molecules; particle desorption; solid target; surface temperature; Apertures; Diodes; Electrodes; Electron beams; Heating; Ionization; Particle beam measurements; Particle beams; Solids; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location
Las Vegas, NV, USA
Print_ISBN
0-7803-7141-0
Type
conf
DOI
10.1109/PPPS.2001.961330
Filename
961330
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