• DocumentCode
    1809319
  • Title

    The impact of particle desorption on DARHT-II electron beam dynamics

  • Author

    Davis, H.A. ; Merrill, F.E. ; Moir, D.C. ; Oro, D.M. ; Vermare, C. ; Wood, W.M. ; Elizondo, J.M. ; Hughes, T.P.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • fYear
    2001
  • fDate
    17-22 June 2001
  • Firstpage
    522
  • Abstract
    Summary form only given, as follows. It is well known in the intense beam community that when an intense electron beam raises the surface temperature of a solid target (e.g., electrode or aperture) to 300-400 deg C, that loosely bound adsorbed molecules are rapidly released from the surface often followed by speedy ionization. This can lead to adverse beam or diode behavior. Less well known is that even in the absence of heating, electron induced desorption of neutrals or ions can have deleterious effects on beam dynamics. We discuss computer modeling to assess the importance of desorbed particles on beam dynamics, experimental measurements to determine the level of induced desorption, and cleaning techniques to reduce adsorbed molecules on surfaces for the DARHT-II, 2 kA, 20 MeV, 2 /spl mu/s beam.
  • Keywords
    electron beams; particle beam dynamics; 2 kA; 20 MeV; 300 to 400 C; DARHT-II electron beam dynamics; beam dynamics; cleaning techniques; computer modeling; electron induced desorption; heating; intense beam community; intense electron beam; loosely bound adsorbed molecules; particle desorption; solid target; surface temperature; Apertures; Diodes; Electrodes; Electron beams; Heating; Ionization; Particle beam measurements; Particle beams; Solids; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-7141-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2001.961330
  • Filename
    961330