• DocumentCode
    180934
  • Title

    On the Generation of Diagnostic Test Set for Intra-cell Defects

  • Author

    Sun, Zhongyuan ; Bosio, A. ; Dilillo, L. ; Girard, P. ; Virazel, A. ; Auvray, E.

  • Author_Institution
    LIRMM, Montpellier, France
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    312
  • Lastpage
    317
  • Abstract
    In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.
  • Keywords
    fault diagnosis; integrated circuit testing; diagnosis resolution; diagnostic test patterns; diagnostic test set; diagnostic test vectors; industrial circuit; intra-cell defects; Automatic test pattern generation; Circuit faults; Computer architecture; Dictionaries; Integrated circuit modeling; Logic gates; Vectors; ATPG; diagnosis; intra-cell defects; test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.57
  • Filename
    6979119
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=180934