Title :
On the Generation of Diagnostic Test Set for Intra-cell Defects
Author :
Sun, Zhongyuan ; Bosio, A. ; Dilillo, L. ; Girard, P. ; Virazel, A. ; Auvray, E.
Author_Institution :
LIRMM, Montpellier, France
Abstract :
In this paper, we investigate the generation of diagnostic test vectors targeting the intra-cell defects. Experimental results carried out on an industrial circuit show that we actually increase the diagnosis resolution by adding few more diagnostic test patterns.
Keywords :
fault diagnosis; integrated circuit testing; diagnosis resolution; diagnostic test patterns; diagnostic test set; diagnostic test vectors; industrial circuit; intra-cell defects; Automatic test pattern generation; Circuit faults; Computer architecture; Dictionaries; Integrated circuit modeling; Logic gates; Vectors; ATPG; diagnosis; intra-cell defects; test;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.57
