Title :
Two-Step Dynamic Encoding for Linear Decompressors
Author_Institution :
Synopsys Inc., Mountain View, CA, USA
Abstract :
In this paper, a new linear decompress or is presented. A specific two-step encoding is incorporated in the implication process to exploit the degree of freedom during ATPG. The proposed decompress or achieves on average 247X test application time reduction for 10 industrial cores. A comparison with multiple seeds per pattern shows that the proposed decompress or achieves higher test application time reduction with fewer test patterns for 7 out of 10 industrial cores.
Keywords :
automatic test pattern generation; encoding; ATPG; dynamic encoding; linear decompressors; multiple seeds; Automatic test pattern generation; Encoding; Equations; Flip-flops; Indexes; Mathematical model; Registers; augmented product codes; dynamic compaction; linear decompressors; test data compression;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.67