• DocumentCode
    180941
  • Title

    On the Use of Scan Chain to Improve Physical Attacks (Extended Abstract)

  • Author

    Junfeng Fan ; Hua Xie ; Yiwei Zhang

  • Author_Institution
    Nationz Technol., Shenzhen, China
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    354
  • Lastpage
    357
  • Abstract
    An unprotected scan-chain makes a perfect back-door in a secure chip. Therefore, many secure chips disable the access to the scan-chains once the testing is completed. In this paper, we consider an attack that is carried out on a blank chip. The scan-chain is still accessible, yet there is no key to be attacked. We show that the attacker can use the scan chain to reveal information that can be used to improve other physical attacks, such side-channel analysis, fault analysis and probing analysis.
  • Keywords
    boundary scan testing; integrated circuit testing; blank chip; fault analysis; physical attacks; probing analysis; scan chain; secure chip; side-channel analysis; Algorithm design and analysis; Ciphers; Circuit faults; Elliptic curve cryptography; Encryption; Registers; Reverse Engineering; Scan Chain; Secure Chip; Side-Channel Attacks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.71
  • Filename
    6979126