Title :
On the Use of Scan Chain to Improve Physical Attacks (Extended Abstract)
Author :
Junfeng Fan ; Hua Xie ; Yiwei Zhang
Author_Institution :
Nationz Technol., Shenzhen, China
Abstract :
An unprotected scan-chain makes a perfect back-door in a secure chip. Therefore, many secure chips disable the access to the scan-chains once the testing is completed. In this paper, we consider an attack that is carried out on a blank chip. The scan-chain is still accessible, yet there is no key to be attacked. We show that the attacker can use the scan chain to reveal information that can be used to improve other physical attacks, such side-channel analysis, fault analysis and probing analysis.
Keywords :
boundary scan testing; integrated circuit testing; blank chip; fault analysis; physical attacks; probing analysis; scan chain; secure chip; side-channel analysis; Algorithm design and analysis; Ciphers; Circuit faults; Elliptic curve cryptography; Encryption; Registers; Reverse Engineering; Scan Chain; Secure Chip; Side-Channel Attacks;
Conference_Titel :
Test Symposium (ATS), 2014 IEEE 23rd Asian
Conference_Location :
Hangzhou
DOI :
10.1109/ATS.2014.71
