DocumentCode :
1809480
Title :
The calculation of quality factor of film bulk acoustic resonators with the consideration of viscosity
Author :
Wang, Ji ; Liu, Jian-song ; Du, Jian-ke ; Huang, De-jin
Author_Institution :
Piezoelectr. Device Lab., Ningbo Univ., Ningbo, China
fYear :
2009
fDate :
17-20 Dec. 2009
Firstpage :
86
Lastpage :
86
Abstract :
With the rapid sophistication of film bulk acoustic resonators (FBAR) technology and increased demands for precision frequency control products, it is natural to make use of the detailed analysis of acoustic waves propagating in the FBAR structures for design and estimating electrical parameters before actual fabrication. To this purpose, it is essential to consider the material viscosity, which is the source of energy loss and dissipation of acoustic wave devices. The dominant viscosity originated from the bonding layers between different materials may not be conveniently represented by additional layers in analysis. To explore the better consideration of viscosity, we assume the bonding layer will be blended into the metal and piezoelectric layers by adding complex elastic constants which are proportional to vibration frequency. The actual value of the viscosity factor is assumed first in our study to examine the effect of parameters, but they can be determined in actual devices through known quality factor of a resonator. In other words, the viscosity factor in our study is given as an equivalent parameter. Such a procedure is useful in understanding the effect of viscosity and their amplitudes while they are considered in different layers. The analytical approach based on wave propagation in layered structures will be important in improving design and conceiving new products.
Keywords :
Q-factor; acoustic resonators; acoustic wave propagation; bulk acoustic wave devices; elasticity; frequency control; piezoelectric materials; vibrations; viscosity; FBAR structures; acoustic wave devices; acoustic wave propagation; bonding layers; complex elastic constant; film bulk acoustic resonators; material viscosity; piezoelectric layer; precision frequency control product; quality factor; vibration frequency; Acoustic propagation; Acoustic waves; Bonding; Fabrication; Film bulk acoustic resonators; Frequency control; Frequency estimation; Parameter estimation; Q factor; Viscosity; FBAR; Quality factor; electrical circuit parameters; film; layered structures; piezoelectric; viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA) and 2009 China Symposium on Frequency Control Technology, Joint Conference of the 2009 Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4950-7
Type :
conf
DOI :
10.1109/SPAWDA.2009.5428886
Filename :
5428886
Link To Document :
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