Title :
Design tradeoffs of CMOS current mirrors using one-equation for all-region model
Author :
Emira, Ahmed ; Sánchez-Sinencio, Edgar ; Schneide, Máircio
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
The design of current mirror involves different conflicting design specifications (noise, bandwidth, input and output resistances, power dissipation, accuracy, THD, etc..), while only three design transistor parameters are available (DC current, width, length). In this paper, we address the effect of such parameters on the current mirror performance. For each specification, an expression is derived which is valid for any inversion level based on the one-equation for all-region MOS model. Experimental results from a current mirror fabricated in 0.5μm AMI CMOS process are found in good agreement with the theoretical ones.
Keywords :
CMOS analogue integrated circuits; current mirrors; harmonic distortion; integrated circuit design; integrated circuit modelling; integrated circuit noise; low-power electronics; 0.5 micron; AMI; CMOS; THD; accuracy; all-region MOS model; all-region model; bandwidth; current mirrors; design specifications; design transistor parameters; input resistances; inversion level; noise; output resistances; power dissipation; Ambient intelligence; Artificial intelligence; CMOS process; Electrical resistance measurement; Equations; MOSFETs; Mirrors; Semiconductor device modeling; Signal design; Voltage;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010636