DocumentCode :
1810030
Title :
Product metrics for IEC 61131-3 languages
Author :
Nair, Amrish
Author_Institution :
ABB Corp. Res., Ind. Software Syst., Bangalore, India
fYear :
2012
fDate :
17-21 Sept. 2012
Firstpage :
1
Lastpage :
8
Abstract :
Quantitative metrics is a key input for improving software development processes. While developing applications using IEC 61131-3 languages, one of the major drawback is unavailability of product metrics. This paper discusses a methodology to define metrics for domain specific languages. Using this methodology, we have defined a set of product metrics that can be used for managing the software project development using IEC 61131-3 languages. We have defined size metrics for these languages using the language specific parameters, which will help the developers for better estimation and tracking the productivity.
Keywords :
IEC standards; project management; software development management; software metrics; specification languages; IEC 61131-3 languages; domain specific languages; language specific parameters; product metrics; quantitative metrics; software development process; software project development management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies & Factory Automation (ETFA), 2012 IEEE 17th Conference on
Conference_Location :
Krakow
ISSN :
1946-0740
Print_ISBN :
978-1-4673-4735-8
Electronic_ISBN :
1946-0740
Type :
conf
DOI :
10.1109/ETFA.2012.6489533
Filename :
6489533
Link To Document :
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