Title :
Simplified current and delay models for deep submicron CMOS digital circuits
Author :
Mansour, Makram M. ; Shanbhag, Naresh R.
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
This paper presents a model for estimating the drain current in deep submicron (DSM) CMOS devices based on Sakurai and Newton´s (1991) work, and hence is referred to as the modified SN-model. The proposed model preserves the simplicity of the SN-model while providing accurate drain current estimates for varying device widths. Manually computed current and delay values for inverter circuits via the proposed model match SPICE level 49 within 1.2% average (3% maximum) error in 0.25 μm and 0.18 μm CMOS processes over a wide range of transistor widths, fanouts, and input rise/fall times. A generalized delay model for circuits with interconnect is also proposed with accuracy within 3% error over a wide range of buffer sizes and interconnect lengths. The proposed model has been successfully incorporated into a senior level circuit design course at the University of Illinois at Urbana-Champaign.
Keywords :
CMOS digital integrated circuits; delay estimation; integrated circuit interconnections; integrated circuit modelling; 0.18 micron; 0.25 micron; SPICE level 49; buffer sizes; deep submicron CMOS digital circuits; delay models; drain current; fanouts; input rise/fall times; interconnect lengths; inverter circuits; modified Sakurai Newton model; transistor widths; CMOS digital integrated circuits; CMOS process; Delay estimation; Digital circuits; Integrated circuit interconnections; Inverters; MOSFETs; SPICE; Semiconductor device modeling; Voltage;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010652