DocumentCode
1810492
Title
Growth and characterization of several piezoelectric crystals with an order langasite structure
Author
Kong, Hai-Kuan ; Zheng, Yan-qing ; Xin, Jun ; Chen, Hui ; Tu, Xiao-niu ; Zeng, Yi-ming
Author_Institution
Shanghai Inst. of Ceramics, Chinese Acad. of Sci., Shanghai, China
fYear
2009
fDate
17-20 Dec. 2009
Firstpage
75
Lastpage
75
Abstract
STGS (Sr3TaGa3Si2O14), SNGS (Sr3NbGa3Si2O14), CTGS (Ca3TaGa3Si2O14) and CTAS (Ca3TaAl3Si2O14) were grown by using the Czochralski method. Selecting a suitable growth direction for the growth of large crystals is very important. STGS and CTGS is easily grown along the X-axis direction, and SNGS is easier to be grown along Y-axis direction than along X-axis direction. CTAS can be pulled along X-axis direction, but there was a serious opaque growth core defect. The measured piezoelectric stress coefficient and dielectric coefficient of crystals showed STGS, SNGS, CTGS and CNAS have similar piezoelectric performance, and the values of e11 are about 2 times than that of the quartz. In addition, the cost of CTAS is lower than that of other three crystals, which make CTAS become a more promising piezoelectric material.
Keywords
aluminium compounds; calcium compounds; crystal defects; crystal growth from melt; gallium compounds; internal stresses; niobium compounds; piezoelectric materials; strontium compounds; tantalum compounds; Ca3TaAl3Si2O14; Ca3TaGa3Si2O14; Czochralski method; Sr3NbGa3Si2O14; Sr3TaGa3Si2O14; X-axis direction; Y-axis direction; crystal growth; dielectric coefficient; opaque growth core defect; order langasite structure; piezoelectric crystals; piezoelectric material; piezoelectric stress coefficient; quartz; Acoustic waves; Ceramics; Chemicals; Costs; Crystalline materials; Crystals; Dielectric measurements; Piezoelectric materials; Stress measurement; Temperature; Crystal growth; Langasite; Piezoelectric;
fLanguage
English
Publisher
ieee
Conference_Titel
Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA) and 2009 China Symposium on Frequency Control Technology, Joint Conference of the 2009 Symposium on
Conference_Location
Wuhan
Print_ISBN
978-1-4244-4950-7
Type
conf
DOI
10.1109/SPAWDA.2009.5428927
Filename
5428927
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