Title :
A 0.06-psRMS SSC-induced jitter, ΔΣ-dithering-free, 6-GHz spread-spectrum clock generator for serial-ATA generation
Author :
Hung, Cheng-Liang ; Cheng, Kuo-Hsing ; Lin, Yu-Chen ; Jiang, Bo-Qian ; Fan, Che-Hao ; Chang, Chi-Yang
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chungli, Taiwan
Abstract :
A 90-nm CMOS, 6-GHz spread-spectrum clock generator (SSCG) showing low jitter and the feasible electromagnetic interference (EMI) reduction is presented. Forsaking the commonly used ΔΣ technique for the average fractional-N ratios by the dithering, the proposed SSCG uses a phase-rotating technique to realize truly fractional division ratios, and creates the spread-spread clocking (SSC) by modulating the fractional-N ratios. The phase-rotating technique effectively calibrates instantaneous timing error and shows ignorable quantization error. Operating at a 6-GHz clock rate, the measured RMS jitter with and without a 0.5% (5000-ppm) down-spreading spectrum are 0.77 ps and 0.71 ps, respectively, showing a significant improvement in the suppressed sub-1ps RMS jitter and the mere increase in RMS jitter of 0.06 ps while implementing SSC. As the serial AT attachment (SATA) standard suggesting the 100 kHz-RBW for the instruments, the measured power attenuation of EMI is 16.12 dB under a 5000-ppm frequency deviation. The chip core area is less than 0.55 × 0.45 mm2, and the core power consumption is 27.7 mW at a 1.0-V supply.
Keywords :
CMOS integrated circuits; clocks; delta-sigma modulation; electromagnetic interference; jitter; ΔΣ technique; CMOS integrated circuits; RMS jitter; SSC-induced jitter; dithering; electromagnetic interference reduction; fractional-N ratios; frequency 6 GHz; instantaneous timing error; phase-rotating technique; power 27.7 mW; quantization error; serial-ATA generation; size 90 nm; spread-spectrum clock generator; spread-spread clocking; time 0.6 ps; time 0.71 ps; time 0.77 ps; truly fractional division ratios; voltage 1 V; Clocks; Electromagnetic interference; Frequency modulation; Generators; Jitter; Phase locked loops; Timing;
Conference_Titel :
ESSCIRC (ESSCIRC), 2011 Proceedings of the
Conference_Location :
Helsinki
Print_ISBN :
978-1-4577-0703-2
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2011.6045003