DocumentCode :
1811046
Title :
Characteristics of Cr-Al-N films prepared by pulsed laser deposition
Author :
Suzuki, Takumi ; Hirai, Makoto ; Suematu, H. ; Jiang, Wei ; Yatsui, K.
Author_Institution :
Nagaoka Univ. of Technol., Niigata, Japan
fYear :
2001
fDate :
17-22 June 2001
Firstpage :
559
Abstract :
Summary form only given, as follows. The synthesis of (Cr/sub 1-x/Al/sub x/)N films is of great interest from a viewpoint of wear-protective coatings with high oxidation. The (Cr/sub 1-x/Al/sub x/)N coatings will provide a promising alternative rather than CrN coatings used conventionally. From such an idea, the preparation of (Cr/sub 1-x/Al/sub x/)N films have been tried by pulsed laser deposition (PLD). YAG laser (3/spl omega/, 355 nm, 7 ns) was used in the experiment. The laser beam was focused by a tens, yielding the energy density of 2 J/cm/sup 2/ on the target. The deposition was carried out for 1 hour at a pulse repetition rate of 10 Hz. Plates of Cr/sub 2/N and AlN were used as the target. The experiment was carried out by changing the surface area ratio of the target (AlN/(Cr/sub 2/N+AlN)) from 0 to 100%. The film composition was measured by energy-dispersive X-ray spectroscopy (EDS) and Rutherford backscattering spectroscopy (RBS). The surface morphology was evaluated by scanning electron microscopy (SEM). The crystal structure of the films was studied by X-ray diffraction (XRD). The hardness of the (Cr/sub 1-x/Al/sub x/) N films showed the maximum value (HV/spl sim/4000) at x = 0.5. Phase transition from the B1 structure to the B4 (wurtzite) structure occurred above x = 0.75, being in reasonable agreement with the theoretical prediction. The result of the oxidation test revealed that the CrN film was oxidized at approximately 600/spl deg/C. Furthermore, in the (Cr/sub 0.5/Al/sub 0.5/) N film, the existence of oxide has not been observed in the annealing temperature between RT to 900/spl deg/C.
Keywords :
Rutherford backscattering; X-ray chemical analysis; aluminium compounds; chromium compounds; crystal structure; plasma materials processing; pulsed laser deposition; scanning electron microscopy; solid-state phase transformations; surface structure; thin films; (Cr/sub 1-x/Al/sub x/)N; (Cr/sub 1-x/Al/sub x/)N films; 355 nm; 600 C; 900 C; Cr-Al-N Films; Phase transition; Rutherford backscattering spectroscopy; X-ray diffraction; YAG laser; crystal structure; energy density; energy-dispersive X-ray spectroscopy; oxidation; pulse repetition rate; pulsed laser deposition; scanning electron microscopy; surface morphology; wear-protective coatings; wurtzite structure; Chromium; Coatings; Energy measurement; Laser beams; Optical pulses; Oxidation; Pulsed laser deposition; Scanning electron microscopy; Spectroscopy; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7141-0
Type :
conf
DOI :
10.1109/PPPS.2001.961389
Filename :
961389
Link To Document :
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