Title :
An efficient modeling approach for substrate noise coupling analysis
Author :
Ozis, Dicle ; Mayaram, Karti ; Fiez, Terri
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Abstract :
A computationally efficient and accurate substrate noise coupling model for heavily doped CMOS processes is presented and validated with simulations and experimental data. The model is based on Z parameters that are scalable with contact separation and size. This results in fast extraction of substrate resistances for large circuit examples. Several examples demonstrate that this approach can be orders of magnitude faster than currently available techniques for substrate resistance extraction. The computed substrate resistances are within 10% of numerical simulations.
Keywords :
CMOS integrated circuits; circuit simulation; heavily doped semiconductors; integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; two-port networks; Z parameters; contact separation; heavily doped CMOS processes; large circuit examples; numerical simulations; scalable Z-parameter based model; simulations; substrate noise coupling model; substrate resistances; two-port resistive network formulation; CMOS process; Circuit noise; Circuit simulation; Contact resistance; Coupling circuits; Data mining; Integrated circuit noise; Low-frequency noise; Radio frequency; Semiconductor device modeling;
Conference_Titel :
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
Print_ISBN :
0-7803-7448-7
DOI :
10.1109/ISCAS.2002.1010684
