Title :
Supercomputer applications to test systems [avionics and weapons applications]
Author :
Lam, Han T. ; Porreca, Dave
Author_Institution :
Titan Syst. Inc., San Diego, CA, USA
Abstract :
The applicability of supercomputer technology to test systems is examined. Potential supercomputer applications to test systems such as testing of very high-speed integrated circuit (VHSIC)-based avionics, fault-tolerance and fault-injection testing, and symptom-based diagnosis are discussed
Keywords :
aircraft instrumentation; automatic test equipment; automatic testing; fifth generation systems; integrated circuit testing; military systems; weapons; ATE; IC testing; VHSIC; avionics; fault-injection testing; fault-tolerance; supercomputer technology; symptom-based diagnosis; very high-speed integrated circuit; weapons; Aerospace electronics; Circuit faults; Circuit testing; Fault tolerant systems; High speed integrated circuits; Integrated circuit technology; Integrated circuit testing; Supercomputers; System testing; Weapons;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9614
