DocumentCode
1811367
Title
Natural Failure Mechanisms: Analysis of Actual Field Returns
Author
Roesch, William J. ; Brockett, Steve
Author_Institution
TriQuint Semicond., Inc., Hillsboro, OR
fYear
2006
fDate
12-12 Nov. 2006
Firstpage
55
Lastpage
71
Abstract
Reliability investigations and product qualifications are typically built on a set of standard aging methods which are designed to extract degradation that can be statistically analyzed in order to predict lifetimes. This study is intended to reveal information about what happens in the real world in terms of reliability. This information is provided as an account of experiences with supplier-customer relationships and expectations and to guide aging and qualification methodologies
Keywords
ageing; customer satisfaction; electronic products; electronics industry; failure analysis; life testing; reliability; actual field returns; aging methods; natural failure mechanisms; product qualifications; reliability investigations; supplier-customer relationships; Aging; Costs; Data mining; Degradation; Design methodology; Failure analysis; Gallium arsenide; Manufacturing; Modems; Qualifications;
fLanguage
English
Publisher
ieee
Conference_Titel
ROCS Workshop, 2006. [Reliability of Compound Semiconductors]
Conference_Location
San Antonio, TX
Print_ISBN
0-7908-0113-2
Type
conf
DOI
10.1109/ROCS.2006.323404
Filename
4118082
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