DocumentCode :
1811393
Title :
Investigating the use of a binary ADC for simultaneous range and velocity processing in a random noise radar
Author :
Thorson, T. Joel ; Akers, Geoffrey A.
Author_Institution :
Grad. Sch. of Eng. & Manage., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear :
2011
fDate :
20-22 July 2011
Firstpage :
270
Lastpage :
275
Abstract :
The Air Force Institute of Technology (AFIT) random noise radar (RNR) implements an ultrawideband (UWB) noise waveform with a single channel receiver and a completely digital correlation processor. Velocity resolution using traditional Doppler processing is degraded as signal bandwidth increases, requiring an alternative velocity estimation technique for the AFIT UWB phase-incoherent RNR. One such technique has been developed at AFIT but is limited by its lengthy processing time and high memory usage. To mitigate the time and memory requirements, a binary analog to digital converter (ADC) is proposed to replace the current eight-bit ADC, sufficiently cutting the signal memory to enable parallel processing and drastically reduce the overall processing time required to simultaneously estimate a target´s range and velocity.
Keywords :
Doppler effect; analogue-digital conversion; correlation methods; military radar; radar receivers; radar signal processing; random noise; ultra wideband radar; waveform analysis; AFIT UWB phase-incoherent RNR; Air Force Institute of Technology; Doppler processing; UWB noise waveform; binary ADC; binary analog-to-digital converter; digital correlation processor; memory requirements; parallel processing; random noise radar; signal bandwidth; signal memory; simultaneous range-velocity processing; single channel receiver; time requirements; ultrawideband noise waveform; velocity estimation technique; velocity resolution; Correlation; Doppler radar; Memory management; Noise; Random access memory; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference (NAECON), Proceedings of the 2011 IEEE National
Conference_Location :
Dayton, OH
ISSN :
0547-3578
Print_ISBN :
978-1-4577-1040-7
Type :
conf
DOI :
10.1109/NAECON.2011.6183113
Filename :
6183113
Link To Document :
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