• DocumentCode
    1811794
  • Title

    Ultra-wideband multichannel receiver test bed

  • Author

    Pogge, James ; Song, Yu ; Guo, Terry ; Qiu, Robert

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tennessee Technol. Univ., Cookville, TN, USA
  • fYear
    2011
  • fDate
    20-22 July 2011
  • Firstpage
    338
  • Lastpage
    343
  • Abstract
    Developing a test bed for the study of UWB (Ultra Wide Band) MIMO (Multi Input Multi Output) systems requires unique capability not necessarily found in common commercially available devices. Some of the characteristics attractive to research test beds are impractical when applied to commercial solutions, this is especially true of UWB where commercial devices targeting accepted applications and changing government standards dictate fairly narrow confines for the operation of UWB signals. This paper is an overview of the techniques, challenges and solutions adapted to a custom receiver front end allowing minimum distortion, noise and interferences while providing the researcher with the most adaptable platform we could provide for the research being performed on the Tennessee Technological University UWB MIMO test bed. In addition, phase noise in the distributive clock is discussed as well. Finally, we introduce the digital section built on a customized multichannel digitizer that is capable of processing data in real time.
  • Keywords
    MIMO communication; distortion; radio receivers; ultra wideband communication; Tennessee Technological University UWB MIMO test bed; UWB MIMO systems; commercial device; customized multichannel digitizer; distributive clock; government standards; phase noise; receiver front end; ultra wide band multiinput multioutput systems; ultra-wideband multichannel receiver test bed; Arrays; Clocks; Field programmable gate arrays; MIMO; Phase noise; Receivers; Low Noise Design; MIMO; UWB;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference (NAECON), Proceedings of the 2011 IEEE National
  • Conference_Location
    Dayton, OH
  • ISSN
    0547-3578
  • Print_ISBN
    978-1-4577-1040-7
  • Type

    conf

  • DOI
    10.1109/NAECON.2011.6183128
  • Filename
    6183128