DocumentCode :
1812092
Title :
Planarity testing for graphs represented by a rotation scheme
Author :
Donafee, A. ; Maple, C.
Author_Institution :
Fac. of Creative Arts & Technol., Univ. of Luton, UK
fYear :
2003
fDate :
16-18 July 2003
Firstpage :
491
Lastpage :
496
Abstract :
Many algorithms exist to determine if a given graph can be embedded in a plane [G. Di Battistia et al., (1994)]. The majority of these methods, however, are only valid for simple graphs and do not take into account the order of edges emanating from each vertex. There are many areas, such as communication design, genetics, group theory, network optimisation and VLSI, where the ordering of edges is crucial to the representation of a system. Rotation schemes can be used to store the ordering of edges around a vertex. Let G be an arbitrary, possibly nonsimple, graph. We provide an algorithm that determines, from the rotation scheme of G, if G can be embedded in the plane. If the rotation scheme of G can be realised by a planar drawing, the regions of G are returned.
Keywords :
VLSI; circuit optimisation; graph theory; group theory; network synthesis; VLSI; communication design; genetics; graph edge order; group theory; network optimisation; nonsimple graph; planar drawing; planarity testing; rotation scheme; Art; Circuit synthesis; Circuit testing; Clocks; Communication networks; Design optimization; Genetics; Large scale integration; Search methods; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Visualization, 2003. IV 2003. Proceedings. Seventh International Conference on
Print_ISBN :
0-7695-1988-1
Type :
conf
DOI :
10.1109/IV.2003.1218030
Filename :
1218030
Link To Document :
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