• DocumentCode
    1812298
  • Title

    The nature of fault exposure ratio

  • Author

    Malaiya, Y.K. ; von Mayrhauser, A. ; Srimani, P.K.

  • Author_Institution
    Dept. of Comput. Sci., Colorado State Univ., Ft. Collins, CO, USA
  • fYear
    1992
  • fDate
    7-10 Oct 1992
  • Firstpage
    23
  • Lastpage
    32
  • Abstract
    The fault exposure ratio K is an important factor that controls the per-fault hazard rate, and hence the effectiveness of software testing. The paper examines the variations of K with fault density which declines with testing time. Because faults get harder to find, K should decline if testing is strictly random. However, it is shown that at lower fault densities K tends to increase, suggesting that real testing is more efficient than random testing. Data sets from several different projects are analyzed. Models for the two factors controlling K are suggested, which jointly lead to the logarithmic model
  • Keywords
    program testing; software reliability; fault density; fault exposure ratio; logarithmic model; per-fault hazard rate; software testing effectiveness; Computer science; Contracts; Fault detection; Hazards; Monitoring; Phase estimation; Phase measurement; Q measurement; Software reliability; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 1992. Proceedings., Third International Symposium on
  • Conference_Location
    Research Triangle Park, NC
  • Print_ISBN
    0-8186-2975-4
  • Type

    conf

  • DOI
    10.1109/ISSRE.1992.285861
  • Filename
    285861