DocumentCode
1812298
Title
The nature of fault exposure ratio
Author
Malaiya, Y.K. ; von Mayrhauser, A. ; Srimani, P.K.
Author_Institution
Dept. of Comput. Sci., Colorado State Univ., Ft. Collins, CO, USA
fYear
1992
fDate
7-10 Oct 1992
Firstpage
23
Lastpage
32
Abstract
The fault exposure ratio K is an important factor that controls the per-fault hazard rate, and hence the effectiveness of software testing. The paper examines the variations of K with fault density which declines with testing time. Because faults get harder to find, K should decline if testing is strictly random. However, it is shown that at lower fault densities K tends to increase, suggesting that real testing is more efficient than random testing. Data sets from several different projects are analyzed. Models for the two factors controlling K are suggested, which jointly lead to the logarithmic model
Keywords
program testing; software reliability; fault density; fault exposure ratio; logarithmic model; per-fault hazard rate; software testing effectiveness; Computer science; Contracts; Fault detection; Hazards; Monitoring; Phase estimation; Phase measurement; Q measurement; Software reliability; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 1992. Proceedings., Third International Symposium on
Conference_Location
Research Triangle Park, NC
Print_ISBN
0-8186-2975-4
Type
conf
DOI
10.1109/ISSRE.1992.285861
Filename
285861
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