DocumentCode :
181245
Title :
Vertical power diodes in bulk GaN
Author :
Disney, Don ; Nie, Hui ; Edwards, Andrew ; Bour, David ; Shah, Hemal ; Kiziyalli, Isik.C. ; Jiang, Qimeng
Author_Institution :
Avogy Inc., San Jose, CA, USA
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
1
Lastpage :
3
Abstract :
Vertical diodes with breakdown voltages up to 2.6kV have been fabricated on bulk GaN substrates. The measured figures-of-merit of these devices show performance near the theoretical limit of GaN. These vertical GaN diodes exhibit robust avalanche behavior with a positive temperature coefficient. System-level performance advantages have been demonstrated in power coversion applications. Statistical data have been collected from thousands of devices. Initial reliability tests have been completed.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI, USA
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6855957
Filename :
6855957
Link To Document :
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