DocumentCode :
1812501
Title :
An conducted electromagnetic interference (EMI) noise source modeling method using Hilbert transform
Author :
Qiu, X.H. ; Zhao, Y. ; Li, S.J. ; Jiang, N.Q. ; Wu, X.H.
Author_Institution :
Coll. of Commun. Eng., Nanjing Post & Telecommun. Univ., Nanjing
Volume :
3
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
1438
Lastpage :
1441
Abstract :
In this paper an approach for power-line EMI (electromagnetic interference) noise source modeling is presented by using Hilbert transform,. First, the importance on EMI noise source modeling., i.e. the source impedance extraction is introduced as the fundamental of power-line EMI filter design for conducted EMI noise suppression. Next, the approach is described and analyzed where the insertion loss method is applied for source impedance amplitude extraction and Hilbert transform method is employed for impedance phase extraction. Simulation and experimental results show that this approach can be utilized effectively for conducted EMI noise source modeling.
Keywords :
Hilbert transforms; electric impedance; electromagnetic interference; EMI noise source modeling; Hilbert transform; conducted electromagnetic interference; electromagnetic interference noise suppression; impedance phase extraction; insertion loss method; power-line electromagnetic interference filter design; power-line electromagnetic interference noise source modeling; source impedance amplitude extraction; source impedance extraction; Circuit noise; Delta modulation; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Electromagnetic modeling; Filters; Impedance measurement; Noise generators; Noise measurement; Hilbert transform; conducted noise source modeling; electromagnetic compatibility (EMC); electromagnetic interference(EMI);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
Type :
conf
DOI :
10.1109/ICMMT.2008.4540715
Filename :
4540715
Link To Document :
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