DocumentCode :
181258
Title :
Advanced cathode and anode injection control concept for 1200V SC(Schottky controlled injection)-diode
Author :
Matsudai, Tomoko ; Ogura, Tsuneo ; Oshino, Yuuichi ; Kobayashi, Takehiko ; Misu, Shinichiro ; Ikeda, Yasuhiro ; Nakamura, Kentaro
Author_Institution :
Discrete Semicond. Div., Toshiba Corp., Kawasaki, Japan
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
19
Lastpage :
22
Abstract :
At ISPSD2013, we presented an SC-diode that realizes low forward voltage drop (VF), low reverse recovery loss and low leakage current at high temperature of over 175 °C, with a combination of very low injection efficiency and high carrier lifetime. This paper proposes an advanced low injection cathode concept with N Schottky region enabling the SC-diode to obtain excellent fast recovery characteristics, realizing a range of 10 kH switching frequency. We discuss a balance of injection efficiency between two sides (anode and cathode), which is very important for reducing voltage ringing during reverse recovery under low current turn-on condition of IGBTs. Furthermore, we have obtained high reverse recovery ruggedness by controlling impact ionization position where is only bottom of deep P anode layer.
Keywords :
Schottky diodes; anodes; cathodes; insulated gate bipolar transistors; ionisation; IGBT; ISPSD2013; Schottky controlled injection; Schottky diode; anode injection control; cathode injection control; forward voltage drop; impact ionization; leakage current; reverse recovery loss; voltage 1200 V; Anodes; Cathodes; Charge carrier lifetime; Charge carrier processes; P-i-n diodes; Schottky diodes; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6855965
Filename :
6855965
Link To Document :
بازگشت