• DocumentCode
    181266
  • Title

    6.5kV RCDC: For increased power density in IGBT-modules

  • Author

    Werber, Dorothea ; Pfirsch, F. ; Gutt, Thomas ; Komarnitskyy, Volodymyr ; Schaeffer, Carsten ; Hunger, Thomas ; Domes, Daniel

  • Author_Institution
    Infineon Technol. AG, Munich, Germany
  • fYear
    2014
  • fDate
    15-19 June 2014
  • Firstpage
    35
  • Lastpage
    38
  • Abstract
    A reverse conducting IGBT in trench technology is presented. By this approach no carrier life time means are necessary to balance static and dynamic losses of the diode. The diode´s p-emitter efficiency can be dynamically tailored by the applied gate voltage due to inversion charge carriers in the vicinity of the gate trench. This opens up the opportunity for a variety of gate control schemes with the aim of a charge carrier reduction before commutation thus reducing the recovery and the corresponding IGBT turn-on losses while the on-state diode losses remain low. A simple substitution of the IGBT and diode dies by the RCDC chips in the industry standard packages enables a significant increase of the power density (e.g. up to 30% for typical traction application) due to a thermal benefit given by lower thermal resistances as well as by a reduction of the dynamic losses due to special gate control.
  • Keywords
    insulated gate bipolar transistors; losses; semiconductor diodes; IGBT turn-on losses; IGBT-modules; RCDC chips; applied gate voltage; carrier lifetime; charge carrier reduction; commutation; diode dynamic losses; diode p-emitter efficiency; diode static losses; gate control schemes; gate trench technology; industry standard packages; inversion charge carriers; on-state diode losses; power density; reverse conducting IGBT with diode control; thermal resistances; voltage 6.5 kV; Charge carriers; Insulated gate bipolar transistors; Logic gates; Silicon; Surges; Switching loss; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-2917-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2014.6855969
  • Filename
    6855969