DocumentCode
1812745
Title
A comparison of MIP-based decomposition techniques and VNS approaches for batch scheduling problems
Author
Klemmt, Andreas ; Weigert, Gerald ; Almeder, Christian ; Mönch, Lars
Author_Institution
Electron. Packaging Lab., Tech. Univ. Dresden, Dresden, Germany
fYear
2009
fDate
13-16 Dec. 2009
Firstpage
1686
Lastpage
1694
Abstract
This research is motivated by a scheduling problem found in the diffusion and oxidation areas of semiconductor wafer fabrication facilities. With respect to some practical motivated process constraints, like equipment dedication and unequal batch-sizes, we model the problem as unrelated parallel batch machines problem with incompatible job families and unequal ready times of the jobs. Our objective is to minimize the total weighted tardiness (TWT) of the jobs. Given that the problem is NP-hard, we propose two different solution approaches. The first approach works with a time window-based mixed integer programming (MIP) decomposition. The second approach uses a variable neighbourhood search (VNS). Using randomly generated test instances, we show that the proposed algorithms outperform common dispatching rules that cannot deal with the given constraints effectively.
Keywords
integer programming; scheduling; semiconductor device manufacture; wafer level packaging; MIP-based decomposition techniques; NP-hard problem; batch scheduling problems; parallel batch machines problem; semiconductor wafer fabrication facilities; total weighted tardiness; variable neighbourhood search; window-based mixed integer programming decomposition; Dispatching; Electronics packaging; Fabrication; Furnaces; Job shop scheduling; Laboratories; Linear programming; Manufacturing; Oxidation; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), Proceedings of the 2009 Winter
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-5770-0
Type
conf
DOI
10.1109/WSC.2009.5429173
Filename
5429173
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