DocumentCode :
181276
Title :
Characterization and application of 600 V normally-off GaN transistors in hard switching DC/DC converters
Author :
Heckel, Thomas ; Frey, Lothar ; Zeltner, Stefan
Author_Institution :
Dept. of Electron Devices, Friedrich-Alexander-Univ. Erlangen-Nuremberg, Erlangen, Germany
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
63
Lastpage :
66
Abstract :
As GaN power devices emerge from research to industry, the characterization of these novel devices itself and its application in power electronic converters is essential. The purpose of this paper is to prove the capabilities of GaN technology using a novel 600 V normally-off GaN-on-Si transistor which shows no dynamic behavior of its on-resistance. A hard switching DC/DC converter prototype reveals efficiencies up to 99.3 % and switching frequencies up to 1 MHz incorporating a high power density up to 28 kW/l.
Keywords :
DC-DC power convertors; III-V semiconductors; elemental semiconductors; gallium compounds; power transistors; silicon; switching convertors; wide band gap semiconductors; GaN; hard switching DC-DC converters; power electronic converters; power transistors; voltage 600 V; Current measurement; Electrical resistance measurement; Gallium nitride; Logic gates; Temperature measurement; Transistors; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6855976
Filename :
6855976
Link To Document :
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