• DocumentCode
    1812911
  • Title

    An efficient technique to calculate the admittance and scattering parameters

  • Author

    De Oliveira, Cicero Hildenberg L. ; Artuzi, Wilson Arnaldo ; Carvalho, Carlos A. T. ; Egoavil Montero, Ciro Jose ; Marcos da Silva, Rogerio

  • Author_Institution
    Electr. Eng. Dept. - DEE/NT, Fed. Univ. of Rondonia - UNIR, Porto Velho, Brazil
  • fYear
    2013
  • fDate
    27-31 Oct. 2013
  • Firstpage
    1330
  • Lastpage
    1333
  • Abstract
    This paper describes an efficient technique to approximate the admittance parameters through a rational function. The parameters measured in the frequency domain were utilized in simulation using the Finite Difference Time Domain (FDTD). The results obtained by simulation are in very good agreement with the analytical results, thereby validating them.
  • Keywords
    S-parameters; electric admittance; finite difference time-domain analysis; rational functions; FDTD; admittance calculation; finite difference time domain; frequency domain; rational function; scattering parameters; Admittance; Approximation methods; Finite difference methods; Mathematical model; Microwave circuits; Time-domain analysis; Admittance Parameters; FDTD; Partial Fractions; Scattering Parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Conference (COBEP), 2013 Brazilian
  • Conference_Location
    Gramado
  • ISSN
    2175-8603
  • Type

    conf

  • DOI
    10.1109/COBEP.2013.6785288
  • Filename
    6785288