Title :
An efficient technique to calculate the admittance and scattering parameters
Author :
De Oliveira, Cicero Hildenberg L. ; Artuzi, Wilson Arnaldo ; Carvalho, Carlos A. T. ; Egoavil Montero, Ciro Jose ; Marcos da Silva, Rogerio
Author_Institution :
Electr. Eng. Dept. - DEE/NT, Fed. Univ. of Rondonia - UNIR, Porto Velho, Brazil
Abstract :
This paper describes an efficient technique to approximate the admittance parameters through a rational function. The parameters measured in the frequency domain were utilized in simulation using the Finite Difference Time Domain (FDTD). The results obtained by simulation are in very good agreement with the analytical results, thereby validating them.
Keywords :
S-parameters; electric admittance; finite difference time-domain analysis; rational functions; FDTD; admittance calculation; finite difference time domain; frequency domain; rational function; scattering parameters; Admittance; Approximation methods; Finite difference methods; Mathematical model; Microwave circuits; Time-domain analysis; Admittance Parameters; FDTD; Partial Fractions; Scattering Parameters;
Conference_Titel :
Power Electronics Conference (COBEP), 2013 Brazilian
Conference_Location :
Gramado
DOI :
10.1109/COBEP.2013.6785288
