Title :
Stochastic interconnect network fan-out distribution using Rent´s rule
Author :
Zarkesh-Ha, Payman ; Davis, Jeffrey A. ; Loh, Wdham ; Meindl, James D.
Author_Institution :
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Based on Rent´s rule, a well-established empirical relationship, a rigorous derivation of the fan-out distribution for random logic networks is performed. Then the maximum fan-out, total number of nets and the average fan-out are presented using the closed form equation of the fan-out distribution. Through comparison with actual product data, it is shown that the model successfully predicts the fan-out distribution of a random logic network
Keywords :
integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; integrated logic circuits; network analysis; stochastic processes; Rent´s rule; average fan-out; closed form equation; fan-out distribution; fan-out distribution model; maximum fan-out; product data; random logic network; random logic networks; stochastic interconnect network fan-out distribution; Equations; Impedance; Large scale integration; Logic; Microelectronics; Optical interconnections; Predictive models; Propagation delay; Research and development; Stochastic processes;
Conference_Titel :
Interconnect Technology Conference, 1998. Proceedings of the IEEE 1998 International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-4285-2
DOI :
10.1109/IITC.1998.704786
