DocumentCode :
181310
Title :
New reverse-conducting IGBT (1200V) with revolutionary compact package
Author :
Takahashi, Koichi ; Yoshida, Sigeru ; Noguchi, So ; Kuribayashi, H. ; Nashida, Norihiro ; Kobayashi, Yoshiyuki ; Kobayashi, Hideo ; Mochizuki, K. ; Ikeda, Yasuhiro ; Ikawa, O.
Author_Institution :
Fuji Electr. Co. Ltd., Matsumoto, Japan
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
131
Lastpage :
134
Abstract :
Fuji Electric developed a 1200V class RC-IGBT based on our latest thin wafer process. The performance of this RC-IGBT shows the same relationship between conduction loss and switching loss as our 6th generation conventional IGBT and FWD. In addition its trade-off can be optimized for hard switching by lifetime killer. Calculations of the hard switching inverter loss and chip junction temperature (Tj) show that the optimized RC-IGBT can handle 35% larger current density per chip area. In order to utilize the high performance characteristics of the RC-IGBT, we assembled them in our newly developed compact package. This module can handle 58% higher current than conventional 100A modules at a 51% smaller footprint.
Keywords :
assembling; current density; insulated gate bipolar transistors; semiconductor device packaging; switching convertors; 6th generation conventional IGBT; FWD; Fuji Electric; RC-IGBT; Tj; chip junction temperature; conduction loss; current 100 A; current density; hard switching inverter loss; reverse-conducting IGBT; revolutionary compact package; switching loss; thin wafer process; voltage 1200 V; Copper; Impedance; Insulated gate bipolar transistors; Inverters; Reliability; Resistance; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6855993
Filename :
6855993
Link To Document :
بازگشت