DocumentCode
1813104
Title
Using multiple tensor deflection to reconstruct white matter fiber traces with branching
Author
Guo, Weihong ; Zeng, Qingguo ; Chen, Yunmei ; Liu, Yijun
Author_Institution
Dept. of Math., Florida Univ., FL
fYear
2006
fDate
6-9 April 2006
Firstpage
69
Lastpage
72
Abstract
The relationship between brain structure and complex behavior is governed by large-scale neurocognitive networks. Diffusion weighted imaging (DWI) is a noninvasive technique that can visualize the neuronal projections connecting the functional centers and thus provides new keys to the understanding of brain function. In this paper, we assume there are up to two diffusion channels at each voxel. A variational framework for 3D simultaneous smoothing and reconstruction of a multi-diffusion tensor field as well as a novel multi-tensor deflection (MTEND) algorithm for extracting white matter fiber traces based on the multi-diffusion tensor field are provided. By applying the proposed model to both synthetic data and human brain high angular resolution diffusion (HARD) magnetic resonance imaging (MRI) data of several subjects, we show the effectiveness of the model in recovering branching fiber traces. Superiority of the proposed model over existing models are also demonstrated
Keywords
biodiffusion; biomedical MRI; brain; image reconstruction; medical image processing; neurophysiology; smoothing methods; brain structure; branching white matter fiber traces; complex behavior; diffusion weighted imaging; human brain high angular resolution diffusion magnetic resonance imaging; image reconstruction; large-scale neurocognitive networks; multidiffusion tensor field; multiple tensor deflection; neuronal projections; smoothing; variational framework; Brain modeling; Data mining; Image reconstruction; Joining processes; Large-scale systems; Magnetic resonance imaging; Noninvasive treatment; Smoothing methods; Tensile stress; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
Conference_Location
Arlington, VA
Print_ISBN
0-7803-9576-X
Type
conf
DOI
10.1109/ISBI.2006.1624854
Filename
1624854
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