DocumentCode :
181326
Title :
Forward-voltage-tunable schottky-integrated trench MOSFETs
Author :
Chuang, Chiao-Shun Patrick ; Chen, Kai-Yu Gary ; Hung, Yu-Ren Ryan ; Ta-Chuan Kuo ; Huang, Cheng-Chin Tony
Author_Institution :
MOSFET BU, DIODES Inc., New Taipei, Taiwan
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
159
Lastpage :
162
Abstract :
We presented the 4-photo-mask schottky-integrated trench MOSFETs. Traditionally monolithic schottky-integrated MOSFETs are composed of two regions: one is MOSFET cells, the other is schottky cells. However, it needs additional mask and processes for schottky structures. 30V schottky-integrated trench MOSFETs by self-aligned schottky into every MOS cell was successfully fabricated in this paper. Trench mask was utilized for body implant and trench etching. Forward voltage (VF) is tunable by tilt angle implant after contact etching. Furthermore, UIS (unclamped Inductive Switching) ability was also improved comparing to conventional trench MOSFETs. Finally, relationship between VF, Idss (drain leakage current), and Qrr (reverse recovery charge) could be optimized for improving the efficiency for DC-DC converters.
Keywords :
MOSFET; etching; masks; 4-photomask Schottky-integrated trench MOSFETs; DC-DC converters; MOSFET cells; Schottky cells; Schottky structures; UIS; contact etching; drain leakage current; forward-voltage-tunable Schottky-integrated trench MOSFETs; monolithic Schottky-integrated MOSFETs; reverse recovery charge; tilt angle implant etching; trench etching; trench mask; unclamped inductive switching ability; voltage 30 V; Etching; Implants; Junctions; MOSFET; Metals; Schottky barriers; Schottky diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6856000
Filename :
6856000
Link To Document :
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