Title :
Failure analysis and optimization for synchronous rectifier Lateral DMOS transistor in DC-DC buck converter
Author :
Siyang Liu ; Bing Yu ; Weifeng Sun ; Jing Zhu ; Chunwei Zhang ; Haisong Li ; Yangbo Yi ; Wei Su ; Kui Xiao ; Guipeng Sun
Author_Institution :
Nat. ASIC Syst. Eng. Res. Center, Southeast Univ., Nanjing, China
Abstract :
In this work, a new failure mechanism for the multifinger synchronous rectifier Lateral DMOS (LDMOS) in an 18V-to-5V DC-DC buck converter under overload current condition has been presented. An optimization structure based on the failure mechanism is also proposed to improve the rated load current of the converter. The novel LDMOS makes the rated load current of the DC-DC converter increase by 17%.
Keywords :
DC-DC power convertors; MOS integrated circuits; failure analysis; rectifiers; DC-DC buck converter; LDMOS; failure analysis; lateral DMOS transistor; multifinger synchronous rectifier; overload current; voltage 18 V to 5 V; Failure analysis; Integrated circuits; MOSFET; Optimization; Power semiconductor devices; Rectifiers;
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
Print_ISBN :
978-1-4799-2917-7
DOI :
10.1109/ISPSD.2014.6856007
