DocumentCode
1813592
Title
In-situ Raman scattering spectroscopy for super resolution optical disk
Author
Kuwahara, Masashi ; Shima, Takayuki ; Tominaga, Junji
Author_Institution
Center for Appl. Near-Field Opt. Res., Nat. Inst. of Adv., Tsukuba
fYear
2009
fDate
10-13 May 2009
Firstpage
52
Lastpage
54
Abstract
We have developed a combined Raman scattering spectroscopy and disk property measurement system to evaluate crystallinity of SRR functional layer inside the rotaed optical disk. The CNR and Raman scattering spectrum can be measured simultaneously from Sb functional layer. Stokes and anti-stokes peak intensities of the spectrum were dependent and independent on the laser power. We have discussed that it is closely related to the SRR phenomenoin.
Keywords
Raman spectra; laser beams; optical disc storage; optical materials; Raman scattering spectroscopy; Stokes intensity; disk property measurement system; laser power; optical disk; optical readout crystallinity; Crystallization; Disk drives; Laser modes; Optical fibers; Optical filters; Optical scattering; Power lasers; Raman scattering; Spectroscopy; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Data Storage Topical Meeting, 2009. ODS '09.
Conference_Location
Lake Buena Vista, FL
Print_ISBN
978-1-4244-3342-1
Electronic_ISBN
978-1-4244-3343-8
Type
conf
DOI
10.1109/ODS.2009.5031751
Filename
5031751
Link To Document