DocumentCode :
181406
Title :
Advanced SOI gate driver IC with integrated VCE-monitoring and negative turn-off gate voltage for medium power IGBT modules
Author :
Vogler, Bastian ; Herzer, Reinhard ; Buetow, Sven ; Mayya, Iyead ; Becker, Steffen
Author_Institution :
SEMIKRON Elektron., Nuremberg, Germany
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
317
Lastpage :
320
Abstract :
A novel approach for medium power IPMs is presented combining 600V and 1200V IGBT/FWD-inverter modules based on spring contact technology with advanced silicon on insulator (SOI) gate driver ICs with fully integrated VCE-monitoring and negative turn-off gate voltage in a reliable cost effective package with excellent thermal conductivity. For the VCE-monitoring of short circuit events the HV-diode and the processing circuit are fully integrated for each switch on the TOP and BOT secondary side. Thanks to the SOI technology which blocks voltages in both directions a negative turn-off gate voltage of -5V can be used for the first time inside an IC to prevent an unmotivated turn-on of the OFF-IGBT during switching of higher currents (>100A) inside a half bridge. The presented static and dynamic measurement results demonstrate the driver and system performance. The new system approach for medium power industrial drive applications supports the market trend towards intelligent power module solutions already known from the low power consumer market.
Keywords :
driver circuits; insulated gate bipolar transistors; integrated circuits; power bipolar transistors; silicon-on-insulator; FWD-inverter modules; SOI; VCE-monitoring; current 100 A; gate driver IC; intelligent power modules; low power consumer market; medium power IGBT modules; medium power industrial drive; negative turn-off gate voltage; silicon-on-insulator; spring contact technology; thermal conductivity; voltage -5 V; voltage 1200 V; voltage 600 V; Bridge circuits; Insulated gate bipolar transistors; Integrated circuits; Logic gates; Monitoring; Silicon-on-insulator; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6856040
Filename :
6856040
Link To Document :
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