DocumentCode :
181424
Title :
Static and dynamic characterization of a >13kV SiC p-ETO device
Author :
Rezaei, Mohammad Ali ; Gangyao Wang ; Huang, Alex Q. ; Lin Cheng ; Scozzie, Charles
Author_Institution :
FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
fYear :
2014
fDate :
15-19 June 2014
Firstpage :
354
Lastpage :
357
Abstract :
This study addresses the transient and steady-state performance of a >13 kV SiC p-ETO. The developed SiC p-ETO is based on a 1 cm2, 15 kV SiC p-GTO with an extremely low differential resistance. Static performance of the device, including the on-state voltage drop at different temperatures and different currents is carried out in this paper. Furthermore, transient performance of the device, including the turn off energy and also the Safe Operating Area (SOA) of the device has been studied. Also, the superior performance of the p-type SiC-ETO has been exploited to design and implement a solid-state circuit breaker. The studies verify the superiority of the SiC pETO compared to other solid state devices for this application.
Keywords :
circuit breakers; silicon compounds; thyristors; wide band gap semiconductors; SiC; emitter turn-off thyristor; gate turn-off thyristor; low differential resistance; p-ETO device; p-GTO; safe operating area; solid-state circuit breaker; steady-state performance; transient performance; Logic gates; MOSFET; Performance evaluation; Silicon carbide; Thyristors; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location :
Waikoloa, HI
ISSN :
1943-653X
Print_ISBN :
978-1-4799-2917-7
Type :
conf
DOI :
10.1109/ISPSD.2014.6856049
Filename :
6856049
Link To Document :
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