• DocumentCode
    1814426
  • Title

    Growth and characterization of bulk GaInSb crystals from non-stoichiometric melts

  • Author

    Bliss, David ; Becla, Piotr

  • Author_Institution
    US Air Force Res. Lab., Hanscom AFB, MA
  • fYear
    2008
  • fDate
    25-29 May 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We have developed the traveling heater method (THM) using a low melting point solvent to grow alloys of GaInSb at constant composition with low defect density. The melting point is reduced by using excess antimony or indium as a solvent. By growing the crystal at low temperature it is possible to avoid the high concentration of gallium antisite defects responsible for the dominant native acceptor concentration. With reduced acceptor concentration, a significant increase in the optical transmission from 2 to 20 mum was observed in crystals grown at low temperature. A series of crystal growth runs has demonstrated the use of off-stoichiometry melts as a means to control the electrical and optical properties of GaInSb alloy crystals.
  • Keywords
    Fourier transform spectra; III-V semiconductors; crystal growth from melt; electron-hole recombination; gallium compounds; indium compounds; infrared spectra; light transmission; semiconductor growth; stoichiometry; FTIR spectroscopy; GaInSb; crystal growth; defect density; electrical properties; electron concentration; gallium antisite defects; gallium indium antimonide alloy crystals; hole concentration; low melting point solvent; nonstoichiometric melts; optical properties; optical transmission; traveling heater method; Crystals; Gallium alloys; Gallium compounds; High speed optical techniques; Indium; Laboratories; Optical control; Solid state circuits; Solvents; Temperature; crystal growth; gallium antimonide; stoichiometry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on
  • Conference_Location
    Versailles
  • ISSN
    1092-8669
  • Print_ISBN
    978-1-4244-2258-6
  • Electronic_ISBN
    1092-8669
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2008.4703008
  • Filename
    4703008