• DocumentCode
    1814491
  • Title

    Pulse discrimination between recoil protons and secondary electrons for a silicon diode based neutron spectrometer

  • Author

    Fazzi, Alberto ; Agosteo, Stefano ; Pola, Andrea ; Varoli, Vincenzo ; Zotto, Pierluigi

  • Author_Institution
    Nucl. Eng. Dept., Politecnico di Milano, Italy
  • Volume
    2
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    767
  • Abstract
    The feasibility of the discrimination between protons and secondary electrons was investigated in order to decrease the lower limit of a recoil-proton spectrometer for neutrons based on a silicon P-i-N diode. The simulation of the ionization generated in the detector by protons and electrons and the simulation of the relevant induced currents show that such discrimination is feasible provided that the "rear side injection" configuration and a low noise set-up are adopted. The difference between the collecting times of the two pulses is maximized and used for the rising time based discrimination. The neutron spectrometer consists of a 3 mm2 area, 300 μm thick silicon P-i-N diode covered with a polyethylene foil on the n-side. The ENC is 720 rms electrons at 20 ns shaping time. Experimental results on monoenergetic neutrons show the effectiveness of this discrimination in decreasing the lower limit of the recoil proton energy spectrum from 1.5 to 0.9 MeV.
  • Keywords
    electron detection; neutron spectrometers; proton detection; secondary electron emission; silicon radiation detectors; 1.5 to 0.9 MeV; 20 ns; 300 micron; Si diode based neutron spectrometer; low noise set-up; pulse discrimination; rear side injection; recoil protons; recoil-proton spectrometer; secondary electrons; silicon P-i-N diode; Detectors; Electrons; Ionization; Neutrons; Noise generators; P-i-n diodes; Polyethylene; Protons; Silicon; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1351811
  • Filename
    1351811