Electrothermal Effects in Bipolar Differential Pairs

Author

La Spina, L. ; d´Alessandro, V. ; Santagata, F. ; Rinaldi, N. ; Nanver, L.K.

Author_Institution

Delft Univ. of Technol., Delft

fYear

2007

fDate

Sept. 30 2007-Oct. 2 2007

Firstpage

131

Lastpage

134

Abstract

The electrothermal behavior of bipolar differential pairs fabricated in silicon-on-glass technology is investigated. Experimental results demonstrate that a considerable distortion of the characteristics may occur when the individual transistors are sensitive to electrothermal effects, with consequent performance and reliability reduction. Simulations are employed to support the measurements and to examine methods to reduce the electrothermal feedback.

Keywords

bipolar transistors; distortion; silicon-on-insulator; bipolar differential pairs; distortion; electrothermal feedback; individual transistors; silicon-on-glass technology; Analog circuits; Analytical models; Bipolar transistors; Circuit simulation; Conducting materials; Electrothermal effects; Performance analysis; Performance evaluation; Silicon on insulator technology; Thermal resistance; Analog circuits; Bipolar Junction Transistor (BJT); differential pair; electrothermal analysis; silicon-on-glass; thermal instability;

fLanguage

English

Publisher

ieee

Conference_Titel

Bipolar/BiCMOS Circuits and Technology Meeting, 2007. BCTM '07. IEEE

Conference_Location

Boston, MA

ISSN

1088-9299

Print_ISBN

978-1-4244-1019-4

Electronic_ISBN

1088-9299

Type

conf

DOI

10.1109/BIPOL.2007.4351853

Filename

4351853