• DocumentCode
    1814903
  • Title

    Threshold current density and emitting wavelength evolution with stack number in InAs quantum dash lasers at 1.55 μm

  • Author

    Zhou, Dayong ; Piron, Rozenn ; Grillot, éFréd ; Dehaese, Olivier ; Homeyer, Estelle ; Batte, Thomas ; Tavernier, Karine ; MacÉ, Erwan ; Even, Jacky ; Le Corre, Alain ; Loualiche, Slimane

  • Author_Institution
    UMR-FOTON, INSA de Rennes, Rennes
  • fYear
    2008
  • fDate
    25-29 May 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The authors demonstrate the achievement of InAs quantum dash lasers grown by molecular beam epitaxy (MBE) on InP (100) substrate. The lasers exhibit lasing wavelength at 1.55 mum by multiple stacked dash layers from two to five, with ground state lasing at room temperature. The threshold current density reaches a minimum value of 683 A/cm2 from double quantum dash structure, resulting from the trade-off between the low number of carrier requirement in the InAs active region and the reduction of carrier concentration in the optical waveguide.
  • Keywords
    III-V semiconductors; carrier density; current density; indium compounds; laser beams; molecular beam epitaxial growth; optical waveguides; quantum dash lasers; semiconductor growth; InAs; InP; InP (100) substrate; carrier concentration; emitting wavelength; lasing wavelength; molecular beam epitaxy; multiple stacked dash layers; optical waveguide; quantum dash lasers; temperature 293 K to 298 K; threshold current density; wavelength 1.55 mum; Indium phosphide; Laser tuning; Molecular beam epitaxial growth; Optical waveguides; Quantum dot lasers; Quantum dots; Quantum well lasers; Surface emitting lasers; Threshold current; Waveguide lasers; Quantum dash laser; molecular beam epitaxy; threshold current density;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2008. IPRM 2008. 20th International Conference on
  • Conference_Location
    Versailles
  • ISSN
    1092-8669
  • Print_ISBN
    978-1-4244-2258-6
  • Electronic_ISBN
    1092-8669
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2008.4703027
  • Filename
    4703027