• DocumentCode
    1815086
  • Title

    Computer aided evaluation of ankylosing spondylitis

  • Author

    Tan, Sovira ; Jianhua Yao ; Ward, Michael M. ; Yao, Lawrence ; Summers, Ronald M.

  • Author_Institution
    Clinical Center, Nat. Inst. of Health, Bethesda, MD
  • fYear
    2006
  • fDate
    6-9 April 2006
  • Firstpage
    339
  • Lastpage
    342
  • Abstract
    Ankylosing spondylitis is a disease of the vertebra where abnormal bone structures (syndesmophytes) grow at intervertebral disk spaces. We provide a quantitative measure of the syndesmophytes using high resolution CT images. The first part of our algorithm segments the whole vertebra using a cascade of successive level sets that address the conflicting requirements of robustness to boundary discontinuities and flexibility needed to capture the fine structures caused by the pathology. The second part of the algorithm segments the syndesmophytes from the vertebral body and quantitates them. We use curvature information to locate the rim and end plates of the vertebra from where syndesmophytes develop. The results of our algorithm were validated by comparison with a semi-quantitative evaluation by a medical expert made by visually inspecting 3-D CT scans. Pearson correlation between the two evaluations is 0.898 (p<0.0001), and Spearman correlation is 0.906 (p<0.0001)
  • Keywords
    bone; computerised tomography; diseases; image segmentation; medical image processing; Pearson correlation; Spearman correlation; abnormal bone structures; ankylosing spondylitis; boundary discontinuities; boundary flexibility; computer aided evaluation; high resolution CT images; image segmentation; intervertebral disk spaces; level sets; pathology; robustness; syndesmophytes; vertebral disease; Arthritis; Biomedical imaging; Bone diseases; Computed tomography; Image resolution; Image segmentation; Level set; Pathology; Radiology; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: Nano to Macro, 2006. 3rd IEEE International Symposium on
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-9576-X
  • Type

    conf

  • DOI
    10.1109/ISBI.2006.1624922
  • Filename
    1624922