DocumentCode :
1815107
Title :
An optimised calibration method of six-port reflectometer
Author :
Xiong, XZ ; Liao, C. ; Xiao, H.Q.
Author_Institution :
Inst. of Electromagn. Field & Microwave Technol., Southwest Jiaotong Univ., Chengdu
Volume :
4
fYear :
2008
fDate :
21-24 April 2008
Firstpage :
1761
Lastpage :
1764
Abstract :
A developed calibration method of six-port junction is proposed, in which a dual-tone technique is used to produce multi-samples and more accurate results are achieved by use of the least-square method and excluding those samples which may cause bigger errors. A 0.9 ~5 GHz MIC six-port reflectometer was constructed and the Engen´s robust calibration procedure was used for comparison. Eight test samples were used in the measurement. For Engen´s calibration procedure, the difference between the HP8510 and the six port reflectrometer is in the order of 0.3 dB/1.6deg for most cases, but at the boundary frequencies the biggest differences are 0.65 dB/2.6deg; while this method give the difference range between the HP8510 is less than 0.1 dB/1deg for most cases and a biggest error of 0.35 dB/1.7deg for boundary frequencies. This method can apparently increase the measure accuracy especially at the boundary frequencies of six-port junction.
Keywords :
calibration; least squares approximations; microwave reflectometry; reflectometers; Engen robust calibration procedure; MIC six-port reflectometer; calibration method; dual-tone technique; frequency 0.9 GHz to 5 GHz; least-square method; six-port junction; Calibration; Electromagnetic fields; Envelope detectors; Frequency measurement; Impedance measurement; Microwave integrated circuits; Microwave technology; Optimization methods; Robustness; Testing; calibration method; dual-tone technique; six-port junction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-1879-4
Electronic_ISBN :
978-1-4244-1880-0
Type :
conf
DOI :
10.1109/ICMMT.2008.4540817
Filename :
4540817
Link To Document :
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