DocumentCode
1815145
Title
Characterization of LTCC substrate up to 100 GHz
Author
Adhikari, S. ; Stelzer, A. ; Springer, A. ; Wagner, C. ; Korden, C. ; Stadler, M.
Author_Institution
Inst. for Commun. & Inf. Eng., Johannes Kepler Univ. Linz, Linz
Volume
4
fYear
2008
fDate
21-24 April 2008
Firstpage
1776
Lastpage
1779
Abstract
This paper deals with the characterization of LTCC substrates up to 100 GHz. Planar transmission lines and resonators are used for characterizing the substrates. Measurement results for the relative permittivity obtained from the investigated structures are presented.
Keywords
planar waveguides; resonators; substrates; transmission lines; LTCC substrate; planar transmission lines; planar transmission resonators; relative permittivity; Conducting materials; Dielectric loss measurement; Frequency; Loss measurement; Microstrip resonators; Millimeter wave measurements; Optical ring resonators; Permittivity measurement; Planar transmission lines; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
Conference_Location
Nanjing
Print_ISBN
978-1-4244-1879-4
Electronic_ISBN
978-1-4244-1880-0
Type
conf
DOI
10.1109/ICMMT.2008.4540821
Filename
4540821
Link To Document