Title :
Simulation of a full 300mm semiconductor manufacturing plant with material handling constraints
Author :
Kiba, Jean-Etienne ; Lamiable, Gilles ; Dauzére-Péres, Stéphane ; Yugma, Claude
Author_Institution :
Dept. of Ind. Eng., STMicroelectronics, Crolles, France
Abstract :
Generally, simulation models encountered in the literature in the context of semiconductor manufacturing are obtained with many assumptions (aggregations) and from partial model simulation of the facility (also called fab). The results obtained can be satisfactory for certain types of studies but, when precise results and understanding of the detailed behavior of local or global parts of the fab are needed, these simplifications may no longer be adequate. A more detailed model and a full-scale simulation are then needed. This article presents a detailed simulation model of the production system and Automated Material Handling System for a 300 mm semiconductor plant. Some of the studies performed with this model are discussed.
Keywords :
industrial plants; manufacturing systems; materials handling; production engineering computing; semiconductor industry; automated material handling system; fab; material handling constraints; production system; semiconductor manufacturing plant; size 300 mm; Brain modeling; Context modeling; Industrial engineering; Logistics; Manufacturing processes; Materials handling; Production systems; Semiconductor device manufacture; Semiconductor device modeling; Virtual manufacturing;
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2009 Winter
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-5770-0
DOI :
10.1109/WSC.2009.5429267