Title :
Electrically Programmable Fuses for Analog and Mixed Signal Applications in Silicon Germanium BiCMOS Technologies
Author :
Gebreselasie, E.G. ; Voldman, S.H. ; He, Z.X. ; Coolbaugh, D. ; Rassel, R.M. ; Kirihata, T. ; Paganini, A. ; Cox, C.G. ; Mongeon, S.A. ; St.Onge, S.A. ; Dunn, J.S. ; Halbach, R.E. ; Lukaitis, J.M.
Author_Institution :
IBM Microelectron., Essex Junction
fDate :
Sept. 30 2007-Oct. 2 2007
Abstract :
An electrically programmable fuse, known as "eFUSE," is used to provide passive device trimming and circuitry fine tuning for analog and mixed signal applications in silicon germanium BiCMOS technologies will be discussed. Timing analysis, pre-and post-programming electrical characterization, and electro-migration failure analysis will be presented.
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; circuit tuning; electric fuses; failure analysis; timing; SiGe; analog signal applications; circuitry fine tuning; electrically programmable fuses; electro-migration failure analysis; mixed signal applications; passive device trimming; silicon germanium BiCMOS technologies; timing analysis; BiCMOS integrated circuits; Circuit optimization; Failure analysis; Fuses; Germanium silicon alloys; Laser tuning; Microelectronics; Silicides; Silicon germanium; USA Councils; BiCMOS; Silicon Germanium; eFUSE; electrically programmable fuses; fuse networks;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2007. BCTM '07. IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-1019-4
Electronic_ISBN :
1088-9299
DOI :
10.1109/BIPOL.2007.4351878
