Electrically Programmable Fuses for Analog and Mixed Signal Applications in Silicon Germanium BiCMOS Technologies

Author

Gebreselasie, E.G. ; Voldman, S.H. ; He, Z.X. ; Coolbaugh, D. ; Rassel, R.M. ; Kirihata, T. ; Paganini, A. ; Cox, C.G. ; Mongeon, S.A. ; St.Onge, S.A. ; Dunn, J.S. ; Halbach, R.E. ; Lukaitis, J.M.

Author_Institution

IBM Microelectron., Essex Junction

fYear

2007

fDate

Sept. 30 2007-Oct. 2 2007

Firstpage

238

Lastpage

241

Abstract

An electrically programmable fuse, known as "eFUSE," is used to provide passive device trimming and circuitry fine tuning for analog and mixed signal applications in silicon germanium BiCMOS technologies will be discussed. Timing analysis, pre-and post-programming electrical characterization, and electro-migration failure analysis will be presented.

Keywords

BiCMOS analogue integrated circuits; Ge-Si alloys; circuit tuning; electric fuses; failure analysis; timing; SiGe; analog signal applications; circuitry fine tuning; electrically programmable fuses; electro-migration failure analysis; mixed signal applications; passive device trimming; silicon germanium BiCMOS technologies; timing analysis; BiCMOS integrated circuits; Circuit optimization; Failure analysis; Fuses; Germanium silicon alloys; Laser tuning; Microelectronics; Silicides; Silicon germanium; USA Councils; BiCMOS; Silicon Germanium; eFUSE; electrically programmable fuses; fuse networks;

fLanguage

English

Publisher

ieee

Conference_Titel

Bipolar/BiCMOS Circuits and Technology Meeting, 2007. BCTM '07. IEEE

Conference_Location

Boston, MA

ISSN

1088-9299

Print_ISBN

978-1-4244-1019-4

Electronic_ISBN

1088-9299

Type

conf

DOI

10.1109/BIPOL.2007.4351878

Filename

4351878