Title :
Reliability correlation between physical and virtual cores at the ISA level
Author :
Garcia, Paulo ; Gomes, Teresa ; Salgado, Filipe ; Cardoso, Pedro ; Cabral, J. ; Ekpanyapong, M.
Abstract :
The proliferation of highly-configurable FPGA technology has allowed the implementation of dedicated systems of diverse configurations and fueled the software to hardware migration paradigm. This work demonstrates how the hardware implementation of virtualization technology affects the system reliability at several levels of abstraction. By correlating faults between the physical and virtual, the reliability impact of hardware-assisted virtualization is shown, as well as how runtime faults are capable of breaching virtualization. ISA profiling is used to assess reliability at early design stages and how its use can serve as a robustness guideline for hardware and software designers is explained.
Keywords :
circuit reliability; field programmable gate arrays; virtualisation; ISA level; ISA profiling; breaching virtualization; hardware-assisted virtualization; highly-configurable FPGA technology; physical cores; reliability correlation; software-to-hardware migration paradigm; system reliability; virtual cores; virtualization technology;
Conference_Titel :
Emerging Technologies & Factory Automation (ETFA), 2012 IEEE 17th Conference on
Conference_Location :
Krakow
Print_ISBN :
978-1-4673-4735-8
Electronic_ISBN :
1946-0740
DOI :
10.1109/ETFA.2012.6489725