DocumentCode :
1815860
Title :
Photoelastic and numerical investigation of thermally-induced restrained shrinkage stresses in plastics
Author :
Sullivan, Tim ; Rosenberg, Jehuda ; Matsuoka, Shiro
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1988
fDate :
11-13 May 1988
Firstpage :
60
Lastpage :
66
Abstract :
A photoelastic analysis is used to determine stress distributions within an epoxy encapsulation material for idealized geometries. Experimental results are compared with analytical and numerical predictions based on actual material data. It is demonstrated that to determine quantitative stress levels using photoelasticity it is necessary to separate orientation effects from an elastically active portion of stress. These `elastic´ stress levels are predicted using linear elastic finite-element models, and agreement with experimental data is obtained when appropriate input parameters are chosen
Keywords :
encapsulation; integrated circuit technology; numerical analysis; packaging; photoelasticity; plastics; polymers; stress analysis; thermal stresses; elastically active portion; epoxy encapsulation material; idealized geometries; linear elastic finite-element models; material data; microelectronic packaging; orientation effects; photoelastic analysis; plastics; stress distributions; Encapsulation; Finite element methods; Microelectronics; Photoelasticity; Plastic packaging; Polymers; Predictive models; Residual stresses; Stress measurement; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal Phenomena in the Fabrication and Operation of Electronic Components: I-THERM '88, InterSociety Conference on
Conference_Location :
Los Angeles, CA
Type :
conf
DOI :
10.1109/ITHERM.1988.28678
Filename :
28678
Link To Document :
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